Implementation and analysis of probabilistic methods for gate-level circuit reliability estimation

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Implementation and Analysis of Probabilistic Methods for Gate-Level Circuit Reliability Estimation

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ژورنال

عنوان ژورنال: Tsinghua Science and Technology

سال: 2007

ISSN: 1007-0214

DOI: 10.1016/s1007-0214(07)70080-9