Implementation and analysis of probabilistic methods for gate-level circuit reliability estimation
نویسندگان
چکیده
منابع مشابه
Implementation and Analysis of Probabilistic Methods for Gate-Level Circuit Reliability Estimation
The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Integrated circuits become more susceptible to soft errors. Therefore, it is imperative to study the reliability of circuits under the soft error. This paper implements three probabilistic methods (two pass, error ...
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ژورنال
عنوان ژورنال: Tsinghua Science and Technology
سال: 2007
ISSN: 1007-0214
DOI: 10.1016/s1007-0214(07)70080-9